UP704
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 421 P_1_0A_L+5VSB_S NA NA VCC      
2 2 1 GND NA NA GND      
3 3 426 P_+1_0V_A_LP__10 NA NA No Test
4 4 424 P_+1_0V_A_PG_10 NA NA       X                                      
5 5 1 GND NA NA GND      
6 6 1 GND NA NA GND      
7 7 436 P_+1_0V_A_VOUT_10 NA NA GND*      
8 8 433 P_+1_0V_A_SW_20 NA NA GND*      
9 9 433 P_+1_0V_A_SW_20 NA NA GND*      
10 10 431 P_+1_0V_A_BST_20 NA NA       X                                      
11 11 425 +1_0V_A_VCC_20 NA NA No Test
12 12 428 P_+1_0V_A_FB_10 NA NA       X                                      
13 13 430 P_+1_0V_A_EN_10 NA NA       X                                      
14 14 1 GND NA NA GND      
15 15 433 P_+1_0V_A_SW_20 NA NA GND*      
16 16 433 P_+1_0V_A_SW_20 NA NA GND*      
Total   10     4                                      
GND*: NET is indirectly connected to GND.

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  Analog Test Digital Test Overall
Tested Pins 4 0 4
Testable Pins 6 6 6
Coverage 66.7% 0.0% 66.7%