UP102
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 1683 P_VCORE_PWM1_10 NA NA No Test
2 2 1 GND NA NA GND      
3 3 1680 P_OD_1_10 NA NA No Test
4 4 1678 P_VCORE_VCC1_R_20 NA NA VCC      
5 5 1321 P_VCORE_LG1_20 NA NA       X                                      
6 6 1320 P_VCORE_PHASE1_20 NA NA No Test
7 7 1675 P_VCORE_HG1_20 NA NA       X                                      
8 8 1672 P_VCORE_BST1_20 NA NA       X                                      
9 9 1 GND NA NA GND      
10 10 1 GND NA NA GND      
11 11 1 GND NA NA GND      
Total   5     3                                      

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  Analog Test Digital Test Overall
Tested Pins 3 0 3
Testable Pins 6 6 6
Coverage 50.0% 0.0% 50.0%