UP704
| |
UNTESTABLE |
ANALOG TESTS |
DIGITAL TESTS |
STUCK FAULT TESTS |
| Pin |
Grid |
Nail |
Net Name |
Pin Attribute |
BScan Attribute |
PWR |
NC |
Analog |
CD |
TJ |
MDA |
STT |
VM |
PAT |
TTL |
MEM |
OBP |
I2C |
BS |
TPG |
TREE |
CLK |
Drives |
Senses |
Stuck Fault Result |
| 1 |
1 |
421 |
P_1_0A_L+5VSB_S |
NA |
NA |
VCC |
|
|
|
| 2 |
2 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 3 |
3 |
426 |
P_+1_0V_A_LP__10 |
NA |
NA |
No Test |
| 4 |
4 |
424 |
P_+1_0V_A_PG_10 |
NA |
NA |
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 5 |
5 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 6 |
6 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 7 |
7 |
436 |
P_+1_0V_A_VOUT_10 |
NA |
NA |
GND* |
|
|
|
| 8 |
8 |
433 |
P_+1_0V_A_SW_20 |
NA |
NA |
GND* |
|
|
|
| 9 |
9 |
433 |
P_+1_0V_A_SW_20 |
NA |
NA |
GND* |
|
|
|
| 10 |
10 |
431 |
P_+1_0V_A_BST_20 |
NA |
NA |
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 11 |
11 |
425 |
+1_0V_A_VCC_20 |
NA |
NA |
No Test |
| 12 |
12 |
428 |
P_+1_0V_A_FB_10 |
NA |
NA |
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 13 |
13 |
430 |
P_+1_0V_A_EN_10 |
NA |
NA |
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 14 |
14 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 15 |
15 |
433 |
P_+1_0V_A_SW_20 |
NA |
NA |
GND* |
|
|
|
| 16 |
16 |
433 |
P_+1_0V_A_SW_20 |
NA |
NA |
GND* |
|
|
|
| Total |
|
10 |
|
|
4 |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
GND*: NET is indirectly connected to GND.
¡@
| |
Analog Test |
Digital Test |
Overall |
| Tested Pins |
4 |
0 |
4 |
| Testable Pins |
6 |
6 |
6 |
| Coverage |
66.7% |
0.0% |
66.7% |