UP103
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 1684 P_VCORE_PWM2_10 NA NA No Test
2 2 1 GND NA NA GND      
3 3 1679 P_OD_2_10 NA NA No Test
4 4 1690 P_VCORE_VCC2_R_20 NA NA VCC      
5 5 1314 P_VCORE_LG2_20 NA NA       X                                      
6 6 1319 P_VCORE_PHASE2_20 NA NA No Test
7 7 1311 P_VCORE_HG2_20 NA NA       X                                      
8 8 1677 P_VCORE_BST2_20 NA NA       X                                      
9 9 1 GND NA NA GND      
10 10 1 GND NA NA GND      
11 11 1 GND NA NA GND      
Total   5     3                                      

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  Analog Test Digital Test Overall
Tested Pins 3 0 3
Testable Pins 6 6 6
Coverage 50.0% 0.0% 50.0%