Test Coverage Report for Board: 80-MB0M80-A01
Create Date: JUL-25-2015

Shorts Coverage
Number of Nets Accessed = 1731  
Total Nets on Board = 2258  
% of Testable Nets = Number of Nets Accessed*100/Total Nets on Board = 76.66%
Number of Nets Not Accessed = 527  
       
Number of Nets Tested = 1731  
% of Nets Tested for Shorts = Number of Nets Tested*100/Total Nets on Board = 76.66%
% of Accessible Nets Tested for Shorts = Number of Nets Tested*100/Number of Nets Accessed = 100.00%

Device Coverage
Device Type Total Devices Un-Testable Testable Tested No Test Coverage (%)
MDA 2217 1329 888 874 14 98.4
IC 43 0 43 24 19 55.8
Non IC 0 0 0 0 0 0.0
Total 2260 1329 931 898 33 96.5

Joint Test Coverage
Device Type Total Joints Un-Testable Testable Tested No Test Coverage (%)
MDA 5413 3058 2355 2215 140 94.1
IC 4226 1534 2692 503 2189 18.7
Total 9639 4592 5047 2718 2329 53.9
Note
1. Joints of both device type are untestable if the device is NC.
2. Joints of MDA device are untestable if the device is parallel (ex,Cap parallel with other caps)
3. Joints of MDA device are untestable if the nail is NP.
4. Joints of MDA device are testable even if the net is GND or VCC.
5. Joints of IC device are untestable if the nail is VCC or GND or NP.
6. Joints are testable if joints are not un-testable.
7. NC: Not mounted, NP: No test nail.

MDA Device Coverage
Device Type Total Devices Un-Testable Testable Tested No Test Coverage (%)
Jumper 584 437 147 136 11 92.5
Resistor 443 10 433 433 0 100.0
Capacitor 970 805 165 162 3 98.2
Bead/Coil 0          
Diode 62 25 37 37 0 100.0
Transistor 158 52 106 106 0 100.0
FET 0          
Others 0          
Total 2217 1329 888 874 14 98.4

IC Device Coverage
Device Loc Side Total Pin PWR/NC Testable Tested Coverage (%) Comment
UL1T1 C1 T 24 4 20 9 45.0  
UL1U1 B1 T 37 8 29 8 27.6  
UF1U1 B4 T 8 2 6 5 83.3  
UBU3 A1 T 20 2 18 0 0.0  
U31P1 C2 T 13 8 5 0 0.0  
U31P3 C2 T 13 8 5 0 0.0  
U31U1 C1 T 8 4 4 0 0.0  
U31U5 D1 T 29 16 13 0 0.0  
U31U6 C1 T 14 2 12 8 66.7  
U3CP1 C1 T 8 3 5 2 40.0  
U3CP2 C1 T 8 3 5 0 0.0  
U3U1 D1 T 77 28 49 0 0.0  
UAU1 A1 T 48 13 35 25 71.4  
UDIA1 D4 T 242 73 169 0 0.0  
UDIA2 D4 T 242 72 170 0 0.0  
UDIB1 D4 T 242 72 170 0 0.0  
UDIB2 D4 T 242 71 171 0 0.0  
UGU1 E1 T 38 12 26 3 11.5  
UGU2 E1 T 53 23 30 11 36.7  
UK1U1 B2 T 128 42 86 61 70.9  
ULGA1 D3 T 1151 418 733 0 0.0  
UO2U1 C3 T 21 8 13 0 0.0  
UOU1 B1 T 64 4 60 42 70.0  
UO310 F4 T 18 15 3 2 66.7  
UO320 B1 T 18 15 3 2 66.7  
UPCI1 B2 T 122 26 96 0 0.0  
UPEX1 C2 T 166 71 95 0 0.0  
UPEX2 A2 T 101 40 61 0 0.0  
UPCX1 B2 T 38 12 26 0 0.0  
UP101 F3 T 57 6 51 43 84.3  
UP102 F2 T 11 5 6 3 50.0  
UP103 F2 T 11 5 6 3 50.0  
UP104 F2 T 11 5 6 3 50.0  
UP201 F3 T 11 5 6 3 50.0  
UP202 F2 T 11 5 6 3 50.0  
UP302 C3 T 8 2 6 0 0.0  
UP501 F4 T 13 4 9 8 88.9  
UP503 C4 T 13 7 6 3 50.0  
UP701 A4 T 13 6 7 0 0.0  
UP704 B4 T 16 10 6 4 66.7  
UP705 B4 T 8 2 6 3 50.0  
UP706 D2 T 13 4 9 7 77.8  
USU1 B3 T 837 442 395 242 61.3  
Total: 43     4226 1583 2643 503 19.0  

Non IC Device Coverage
Device Loc Side Total Pin PWR/NC Testable Tested Coverage (%) Comment
Total: 0     0 0 0 0 0.0  

Color Definition
  No Test Device