UL1T1
| |
UNTESTABLE |
ANALOG TESTS |
DIGITAL TESTS |
STUCK FAULT TESTS |
| Pin |
Grid |
Nail |
Net Name |
Pin Attribute |
BScan Attribute |
PWR |
NC |
Analog |
CD |
TJ |
MDA |
STT |
VM |
PAT |
TTL |
MEM |
OBP |
I2C |
BS |
TPG |
TREE |
CLK |
Drives |
Senses |
Stuck Fault Result |
| 1 |
1 |
738 |
L1_CTR |
NA |
NA |
GND |
|
|
|
| 2 |
2 |
0 |
L1_MDI_N3 |
NA |
NA |
No Test |
| 3 |
3 |
0 |
L1_MDI_P3 |
NA |
NA |
No Test |
| 4 |
4 |
738 |
L1_CTR |
NA |
NA |
GND |
|
|
|
| 5 |
5 |
0 |
L1_MDI_N2 |
NA |
NA |
No Test |
| 6 |
6 |
0 |
L1_MDI_P2 |
NA |
NA |
No Test |
| 7 |
7 |
738 |
L1_CTR |
NA |
NA |
GND |
|
|
|
| 8 |
8 |
0 |
L1_MDI_N1 |
NA |
NA |
No Test |
| 9 |
9 |
0 |
L1_MDI_P1 |
NA |
NA |
No Test |
| 10 |
10 |
738 |
L1_CTR |
NA |
NA |
GND |
|
|
|
| 11 |
11 |
0 |
L1_MDI_N0 |
NA |
NA |
No Test |
| 12 |
12 |
0 |
L1_MDI_P0 |
NA |
NA |
No Test |
| 13 |
13 |
734 |
L1_TR_P0 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 14 |
14 |
1249 |
L1_TR_N0 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 15 |
15 |
751 |
L1_CMT3 |
NA |
NA |
No Test |
| 16 |
16 |
1248 |
L1_TR_P1 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 17 |
17 |
1251 |
L1_TR_N1 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 18 |
18 |
750 |
L1_CMT2 |
NA |
NA |
No Test |
| 19 |
19 |
1250 |
L1_TR_P2 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 20 |
20 |
1247 |
L1_TR_N2 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 21 |
21 |
748 |
L1_CMT1 |
NA |
NA |
No Test |
| 22 |
22 |
1246 |
L1_TR_P3 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 23 |
23 |
1252 |
L1_TR_N3 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 24 |
24 |
737 |
L1_CMT0 |
NA |
NA |
|
|
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| Total |
|
4 |
|
|
|
|
9 |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
¡@
| |
Analog Test |
Digital Test |
Overall |
| Tested Pins |
9 |
0 |
9 |
| Testable Pins |
20 |
20 |
20 |
| Coverage |
45.0% |
0.0% |
45.0% |