UP104
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 1685 P_VCORE_PWM3_10 NA NA No Test
2 2 1 GND NA NA GND      
3 3 1689 P_OD_3_10 NA NA No Test
4 4 1688 P_VCORE_VCC3_R_20 NA NA VCC      
5 5 1227 P_VCORE_LG3_20 NA NA       X                                      
6 6 1199 P_VCORE_PHASE3_20 NA NA No Test
7 7 1315 P_VCORE_HG3_20 NA NA       X                                      
8 8 1691 P_VCORE_BST3_20 NA NA       X                                      
9 9 1 GND NA NA GND      
10 10 1 GND NA NA GND      
11 11 1 GND NA NA GND      
Total   5     3                                      

¡@

  Analog Test Digital Test Overall
Tested Pins 3 0 3
Testable Pins 6 6 6
Coverage 50.0% 0.0% 50.0%