UP701
| |
UNTESTABLE |
ANALOG TESTS |
DIGITAL TESTS |
STUCK FAULT TESTS |
| Pin |
Grid |
Nail |
Net Name |
Pin Attribute |
BScan Attribute |
PWR |
NC |
Analog |
CD |
TJ |
MDA |
STT |
VM |
PAT |
TTL |
MEM |
OBP |
I2C |
BS |
TPG |
TREE |
CLK |
Drives |
Senses |
Stuck Fault Result |
| 1 |
1 |
430 |
P_+1_0V_A_EN_10 |
NA |
NA |
No Test |
| 2 |
2 |
316 |
N28559643 |
NA |
NA |
No Test |
| 3 |
3 |
318 |
+1_8V_A |
NA |
NA |
No Test |
| 4 |
4 |
318 |
+1_8V_A |
NA |
NA |
No Test |
| 5 |
5 |
318 |
+1_8V_A |
NA |
NA |
No Test |
| 6 |
6 |
423 |
+5VSB |
NA |
NA |
VCC |
|
|
|
| 7 |
7 |
423 |
+5VSB |
NA |
NA |
VCC |
|
|
|
| 8 |
8 |
423 |
+5VSB |
NA |
NA |
VCC |
|
|
|
| 9 |
9 |
315 |
P_1_8V_A_EN_10 |
NA |
NA |
No Test |
| 10 |
10 |
314 |
P_1_8V_A__CTRL_10 |
NA |
NA |
No Test |
| 11 |
11 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 12 |
12 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 13 |
13 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| Total |
|
6 |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
¡@
| |
Analog Test |
Digital Test |
Overall |
| Tested Pins |
0 |
0 |
0 |
| Testable Pins |
7 |
7 |
7 |
| Coverage |
0.0% |
0.0% |
0.0% |