UBU3
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 4 +12V NA NA No Test
2 2 105 LS_COM1_DCD1_ NA NA No Test
3 3 108 LS_COM1_DSR1_ NA NA No Test
4 4 104 LS_COM1_RXD1 NA NA No Test
5 5 110 LS_COM1_RTS1_ NA NA No Test
6 6 106 LS_COM1_TXD1 NA NA No Test
7 7 109 LS_COM1_CTS1_ NA NA No Test
8 8 107 LS_COM1_DTR1_ NA NA No Test
9 9 111 LS_COM1_RI1_ NA NA No Test
10 10 5 -12V NA NA No Test
11 11 1 GND NA NA GND      
12 12 79 O_COM1_RI1__Q NA NA No Test
13 13 78 O_COM1_DTR1_ NA NA No Test
14 14 80 O_COM1_CTS1_ NA NA No Test
15 15 86 O_COM1_TXD1 NA NA No Test
16 16 87 O_COM1_RTS1_ NA NA No Test
17 17 658 O_COM1_RXD1 NA NA No Test
18 18 77 O_COM1_DSR1_ NA NA No Test
19 19 88 O_COM1_DCD1_ NA NA No Test
20 20 3 +5V NA NA VCC      
Total   2                                            

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  Analog Test Digital Test Overall
Tested Pins 0 0 0
Testable Pins 18 18 18
Coverage 0.0% 0.0% 0.0%